Speckles removal from interference patterns illuminated by coherent light using empirical mode decomposition

The speckle that is formed in coherent illumination confuses efforts to record an object's fine details. The confusion is particularly severe in optical metrology and microscopy. In this paper, a scheme using the empirical mode decomposition (EMD) to remove speckles is proposed. This makes it possible to accurately evaluate phases from a fringe pattern illuminated by a coherent light source.