Observation of metal precipitates at prebreakdown sites in multicrystalline silicon solar cells

The local prebreakdown behavior of a damage etched multicrystalline silicon solar cell produced from virgin grade feedstock was characterized. At the position of micrometer-scaled prebreakdown sites, which correlate with recombination active defects found along grain boundaries, micro-x-ray fluorescence mappings revealed the presence of Fe precipitate colonies. These measurements represent direct evidence that transition metal clusters lead to decreased breakdown voltage and cause soft diode breakdown.

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