LED life prediction based on lumen depreciation and colour shift

Light emitting diodes, with advantages in energy savings, luminous efficacy and greater reliability, are becoming preferred over conventional white light sources. Currently, only light output depreciation is considered for life estimation of light emitting diode luminaires but it is recommended to include colour shift variations for applications demanding colour stability. In this paper, an extended Kalman filter is employed to determine L70 life and colour temperature degradation over life of a light emitting diode luminaire. The colour shift in terms of Duv is determined by statistical polynomial cure fitting. The variation in chromaticity coordinates over life is determined and life based on colour shift is determined by acceptable Duv limits. The results are compared to life determined by the IES-TM-21 method and the correlated colour temperature limits taken from the luminaire data sheet.

[1]  Paul Zarchan,et al.  Fundamentals of Kalman Filtering: A Practical Approach , 2001 .

[2]  T. Başar,et al.  A New Approach to Linear Filtering and Prediction Problems , 2001 .

[3]  A. Robertson Computation of Correlated Color Temperature and Distribution Temperature , 1968 .

[4]  M.G. Pecht,et al.  Prognostics and health management of electronics , 2008, IEEE Transactions on Components and Packaging Technologies.

[5]  H.F. Durrant-Whyte,et al.  A new approach for filtering nonlinear systems , 1995, Proceedings of 1995 American Control Conference - ACC'95.

[6]  D. Simon Optimal State Estimation: Kalman, H Infinity, and Nonlinear Approaches , 2006 .

[7]  Pradeep Lall,et al.  Prediction of L70 Life and Assessment of Color Shift for Solid-State Lighting Using Kalman Filter and Extended Kalman Filter-Based Models , 2015, IEEE Transactions on Device and Materials Reliability.

[8]  H. Akaike A new look at the statistical model identification , 1974 .

[9]  M. Pecht,et al.  Lifetime Estimation of High-Power White LED Using Degradation-Data-Driven Method , 2012, IEEE Transactions on Device and Materials Reliability.

[10]  A. Robertson,et al.  Colorimetry: Fundamentals and Applications , 2005 .

[11]  M. Pecht,et al.  Physics-of-Failure-Based Prognostics and Health Management for High-Power White Light-Emitting Diode Lighting , 2011, IEEE Transactions on Device and Materials Reliability.

[12]  Jong Kyu Kim,et al.  Solid-State Light Sources Getting Smart , 2005, Science.