Prognostics of electronic systems through power supply current trends

As today's avionic systems highly rely on electronic components, the prognostic of electronic systems in the context of avionics has become crucial. This paper presents a prognostic method applicable to electronic components and systems based on the analysis of the power supply current. In this method, the focus is on trends in the measured power supply current of the device under prognostic process. The discussion in this paper reveals that there is a measurable relationship between the supply current and the remaining lifetime of the electronic devices. The presented methodology is supported by circuit simulations performed on a system consisting of reference circuitry. The prognostic method shows great promise due to the ability of being applicable at any prognostic level.

[1]  Frank L. Lewis,et al.  Intelligent Fault Diagnosis and Prognosis for Engineering Systems , 2006 .

[2]  Chenming Hu,et al.  Hot-electron-induced MOSFET degradation—Model, monitor, and improvement , 1985, IEEE Transactions on Electron Devices.

[3]  Chenming Hu,et al.  Hot-Electron-Induced MOSFET Degradation - Model, Monitor, and Improvement , 1985, IEEE Journal of Solid-State Circuits.

[4]  N. Vichare,et al.  Prognostics Implementation Methods for Electronics , 2007, 2007 Annual Reliability and Maintainability Symposium.

[5]  D. L. Goodman Prognostic methodology for deep submicron semiconductor failure modes , 2001 .

[6]  M. Ruberto,et al.  Consideration of age degradation in the RF performance of CMOS radio chips for high volume manufacturing , 2005, 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers.

[7]  Kyung-Im Son,et al.  Dynamic Life-Estimation of CMOS ICs in Real Operating Environment: Precise Electrical , 1997 .

[8]  Jonas Johansson,et al.  On Thermomechanical Durability Analysis Combined With Computational Fluid Dynamics Thermal Analysis , 2007 .

[9]  H. Hecht,et al.  Why prognostics for avionics? , 2006, 2006 IEEE Aerospace Conference.

[10]  R. Rajsuman,et al.  Iddq testing for CMOS VLSI , 1994, Proceedings of the IEEE.

[11]  Robert H. Sloan,et al.  Examining Smart-Card Security under the Threat of Power Analysis Attacks , 2002, IEEE Trans. Computers.

[12]  P. Lall,et al.  Prognostics and health management of electronics , 2006, 2006 11th International Symposium on Advanced Packaging Materials: Processes, Properties and Interface.

[13]  D. Droste,et al.  Prognostics for Electronic Systems , 2006, 2006 IEEE Autotestcon.

[14]  George Vachtsevanos,et al.  A Particle Filtering Framework for Failure Prognosis , 2005 .

[15]  Siva Sai Yerubandi,et al.  Differential Power Analysis , 2002 .

[16]  P.W. Kalgren,et al.  Prognostic health management for avionic systems , 2006, 2006 IEEE Aerospace Conference.

[17]  M. Pecht,et al.  Life consumption monitoring for electronics prognostics , 2004, 2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720).

[18]  Peter Söderholm A system view of the No Fault Found (NFF) phenomenon , 2007, Reliab. Eng. Syst. Saf..

[19]  J. Martin-Martinez,et al.  Gate Oxide Wear-Out and Breakdown Effects on the Performance of Analog and Digital Circuits , 2008, IEEE Transactions on Electron Devices.