Inverse analysis of diffuse reflectance for surface-distributed particles using absorbance basis functions

This study describes inverse spectral analysis of diffuse reflectance for surface-distributed material particles on substrates. In particular, an algorithm for extraction of target spectral features for surface-distributed materials of specified dielectric response. This algorithm is based on diffuse-reflectance theory and linear combinations of basis functions representing response characteristics of different types of scattering processes. The basis functions are constructed using absorbance functions and analytical models of Mie-type scattering. Prototype inverse spectral analysis of diffuse reflectance for surface-distributed explosive particles on substrates are described, which demonstrate characteristics of the algorithm.