Machine learning techniques to predict sensitive patterns to fault attack in the Java Card application

Abstract Fault attack represents one of the serious threats against Java Card security. It consists of physical perturbation of chip components to introduce faults in the code execution. A fault may be induced using a laser beam to impact opcodes and operands of instructions. This could lead to a mutation of the application code in such a way that it becomes hostile. Any successful attack may reveal a secret information stored in the card or grant an undesired authorisation. We propose a methodology to recognise, during the development step, the sensitive patterns to the fault attack in the Java Card applications. It is based on the concepts from text categorisation and machine learning. In fact, in this method, we represented the patterns using opcodes n-grams as features, and we evaluated different machine learning classifiers. The results show that the classifiers performed poorly when classifying dangerous sensitive patterns, due to the imbalance of our data-set. The number of dangerous sensitive patterns is much lower than the number of not dangerous patterns. We used resampling techniques to balance the class distribution in our data-set. The experimental results indicated that the resampling techniques improved the accuracy of the classifiers. In addition, our proposed method reduces the execution time of sensitive patterns classification in comparison to the SmartCM tool. This tool is used in our study to evaluate the effect of faults on Java Card applications.