Semiconductor memory device having mount test circuits and method for mount testing

A semiconductor memory device having a mount test circuit and a mount test method are provided to reduce a test time by performing a test in a mounting state of a semiconductor memory. A mount test circuit includes at least two memory blocks(112,114), a comparison unit(120), and an output selection unit(130). The two memory blocks are selected from memory blocks. The comparison unit compares test data with each other, determines the identity of the test data, and outputs a pass signal or a fail signal as a flag signal. The output selection unit composes a data output path by altering the memory block as the output target whenever the comparison unit outputs the fail signal.