Open architecture test system: system architecture and design

The open architecture test system provides a method and framework under which software and instruments of different vendors can be developed and integrated into an ATE. In This work, we describe the overall architecture and design of the system. First we describe the architecture and the control mechanism for the overall system and for individual test-sites. Data and command communication mechanism among these control elements is explained. After this general structure, we describe how this architecture allows deployment of third party instruments and modules, what are the interfaces, how system is configured and how correct operation of the system is ensured after plugging-in a third party module.

[1]  Philippe Kruchten,et al.  What Is the Rational Unified Process ? , 2001 .

[2]  S. M. Perez,et al.  Open architecture test system: the new frontier , 2003, IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003..

[3]  Rochit Rajsuman An overview of the open architecture test system , 2004, Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications.