论文信息 - A simple and accurate method for extracting the emitter and thermal resistance of BJTs and HBTs

A simple and accurate method for extracting the emitter and thermal resistance of BJTs and HBTs

A simple yet accurate extraction method for the emitter and thermal resistance of bipolar transistors is presented. Only DC measurements taken on a thermally controlled wafer prober are required. The knowledge of the collector resistance is preferable, but not mandatory. The method yields excellent results when applied to advanced HBT technologies.

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