In-plane displacement measurement in vortex metrology by synthetic network correlation fringes.

Recently we proposed an alternative method of displacement analysis in vortex metrology, based on the application of the Fourier optics techniques, that is suitable for an intermediate range of displacement measurements ranging below the resolution of speckle photography and above that of the conventional vortex metrology. However, for smaller displacements, we introduce an approach to perform the Fourier analysis from vortex networks. In this work, we present an enhanced method for measuring uniform in-plane displacements, taking advantage of the capability of determining the subpixel locations of vortices and having the ability to track the homologous vortices onto a plane. It is shown that high-quality fringe systems can be synthesized and analyzed to accurately measure in an extended range of displacements and for highly decorrelated speckle patterns. Experimental results supporting the validity of the method are presented and discussed.

[1]  Daniel Sierra-Sosa,et al.  Vortex metrology using Fourier analysis techniques: vortex networks correlation fringes. , 2012, Applied optics.

[2]  Daniel Sierra-Sosa,et al.  Speckle decorrelation influence on measurements quality in vortex metrology , 2012 .

[3]  M. Takeda,et al.  Optical Vortex Metrology , 2011 .

[4]  M. Tebaldi,et al.  Multiple-aperture speckle method applied to local displacement measurements , 2007 .

[5]  M. Tebaldi,et al.  Multiple rotation assessment through isothetic fringes in speckle photography. , 2007, Applied optics.

[6]  Mitsuo Takeda,et al.  Optical vortex metrology based on the core structures of phase singularities in Laguerre-Gauss transform of a speckle pattern. , 2006, Optics express.

[7]  Wei Wang,et al.  Optical vortex metrology for nanometric speckle displacement measurement. , 2006, Optics express.

[8]  P. Senthilkumaran Optical phase singularities in detection of laser beam collimation. , 2003, Applied optics.

[9]  M. Tebaldi,et al.  Properties of speckle patterns generated through multiaperture pupils , 2001 .

[10]  F. Chiang,et al.  Strain analysis by one-beam laser speckle interferometry. 2: Multiaperture method. , 1976, Applied optics.

[11]  M Trivi,et al.  Speckle photography with different pupils in a multiple-exposure scheme. , 2000, Journal of the Optical Society of America. A, Optics, image science, and vision.

[12]  F. Chiang,et al.  Strain analysis by one-beam laser speckle interferometry. 1: Single aperture method. , 1976, Applied optics.