Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic features
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C. Lien | Shih-Hsien Yang | Yen‐Fu Lin | Yuan-Ming Chang | C. Ho | Ko-Chun Lee | Feng‐Shou Yang | Mengjiao Li | Wenwu Li | Y. Chou | Haifeng Ling | Mu‐Pai Lee | Jiann-Yeu Chen | Chen‐Hsin Lien | I-Ying Ho | Yuanzhe Li | Jen-Kuei Chang