Test handler, transfering method of testtray, and manufacturing method of semiconductor using the same

A test handler, and the test tray transfer method and the fabricating method of semiconductor device using the test handler are provided to test the plurality of semiconductor devices in a short time by reducing the time required for the loading process and the unloading process. The test handler comprises the loading unit(40) in which the test tray ascends and descends between the loading area and taking-out region; the unloading unit(50) in which the test tray ascends and descends between the unloading region and the import region; the wait buffer keeping a plurality of semiconductor devices which complete the test; the guide member movable to the direction which is parallel to the traveling direction of the wait buffer in order to guide the movement of the test tray.