Evaluation and Application of U.S. Medical Proton Facilities for Single Event Effects Test

We present the challenges of using new medical proton therapy cyclotrons for SEE tests in the 200 MeV regime. Solutions are discussed to utilize these facilities as a replacement for the Indiana University Cyclotron Facility. Part data response to conventional scattered proton beams are compared to newer scanning beam configurations. A common dosimetry system for independent determination of fluence and beam uniformity is presented.

[1]  M.A. McMahan,et al.  Standard Practice for Dosimetry of Proton Beams for use in Radiation Effects Testing of Electronics , 2008, 2008 IEEE Radiation Effects Data Workshop.

[2]  C. C. Foster,et al.  Radiation effects facilities, dosimetry, and program at the Indiana University cyclotron facility , 2001 .

[3]  M. Simons,et al.  Hardness Assurance Test Guideline for Qualifying Devices for Use in Proton Environments , 2009, IEEE Transactions on Nuclear Science.

[4]  G. L. Hash,et al.  Effects of particle energy on proton-induced single-event latchup , 2005, IEEE Transactions on Nuclear Science.

[5]  Harald Paganetti,et al.  Monte Carlo calculations for absolute dosimetry to determine machine outputs for proton therapy fields , 2006, Physics in medicine and biology.

[6]  R. Wilson.  Radiological use of fast protons. , 1946, Radiology.

[7]  S. E. Swanson,et al.  Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam , 2014, IEEE Transactions on Nuclear Science.

[8]  T. Rinckel,et al.  Beam Properties of the new Radiation Effects Research Stations at Indiana University Cyclotron Facility , 2004 .

[9]  G. Boissonnat,et al.  Characterization and performances of a monitoring ionization chamber dedicated to IBA-universal irradiation head for Pencil Beam Scanning , 2013, 1306.6907.

[10]  M.D. Berg,et al.  Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM , 2009, IEEE Transactions on Nuclear Science.

[11]  H.H.K. Tang,et al.  Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells , 2007, IEEE Transactions on Nuclear Science.

[12]  Harald Paganetti,et al.  Proton therapy physics , 2011 .

[13]  B. Jones,et al.  Particle Therapy Co-operative Oncology Group (PTCOG 40) meeting, Institute Curie 2004. , 2005, The British journal of radiology.