论文信息 - Wavelength dispersion in one-crystal and two-crystal X-ray spectrometry. A general treatment

Wavelength dispersion in one-crystal and two-crystal X-ray spectrometry. A general treatment

The representation in Δω, Δ2θ space of the components of diffraction associated with a single-crystal reflection is proposed as an alternative to the DuMond diagram. The capabilities of this representation in relation to one- and two-crystal spectrometry are discussed. It is shown that these two types of system have close similarity and can be integrated within a general treatment using Δω, Δ2θ space.

A. Mathieson

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