In situ X-ray measurements over large Q-space to study the evolution of oxide thin films prepared by RF sputter deposition
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P. Walter | M. Scholz | A. Dippel | U. Klemradt | A. Rothkirch | A. Resta | D. Haas | S. Schipmann | O. Seeck | A. Vlad | O. Faley | J. Wernecke | J. Blume | D. Reuther | A. Nent