Multiple-Cell Upsets Induced by Single High-Energy Electrons
暂无分享,去创建一个
Adam R. Duncan | Dobrin P. Bossev | Matthew J. Gadlage | Matthew J. Kay | M. Gadlage | A. Roach | A. Duncan | Aaron M. Williams | D. Bossev | M. Kay | Austin H. Roach
[1] Michael J. Wirthlin,et al. High-Reliability FPGA-Based Systems: Space, High-Energy Physics, and Beyond , 2015, Proceedings of the IEEE.
[2] J. W. Watts,et al. CRÈME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code , 2012, IEEE Transactions on Nuclear Science.
[3] M. Gadlage,et al. Soft Errors Induced by High-Energy Electrons , 2017, IEEE Transactions on Device and Materials Reliability.
[4] N. Chatry,et al. Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology , 2014, IEEE Transactions on Nuclear Science.
[5] peixiong zhao,et al. Monte Carlo Simulation of Single Event Effects , 2010, IEEE Transactions on Nuclear Science.
[6] J.D. Cressler,et al. Multiple-Bit Upset in 130 nm CMOS Technology , 2006, IEEE Transactions on Nuclear Science.
[7] R.A. Reed,et al. Increased Rate of Multiple-Bit Upset From Neutrons at Large Angles of Incidence , 2008, IEEE Transactions on Device and Materials Reliability.
[8] peixiong zhao,et al. Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs , 2015, IEEE Transactions on Nuclear Science.
[9] Adam R. Duncan,et al. Electron-Induced Single-Event Upsets in 45-nm and 28-nm Bulk CMOS SRAM-Based FPGAs Operating at Nominal Voltage , 2015, IEEE Transactions on Nuclear Science.
[10] H. Takai,et al. Soft error rate estimations of the Kintex-7 FPGA within the ATLAS Liquid Argon (LAr) Calorimeter , 2014 .
[11] J. K. Wang,et al. Electron-Induced Single-Event Upsets in Static Random Access Memory , 2013, IEEE Transactions on Nuclear Science.
[12] peixiong zhao,et al. The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs , 2010, IEEE Transactions on Nuclear Science.
[13] Heather Quinn,et al. A Method and Case Study on Identifying Physically Adjacent Multiple-Cell Upsets Using 28-nm, Interleaved and SECDED-Protected Arrays , 2014, IEEE Transactions on Nuclear Science.
[14] V. Ferlet-Cavrois,et al. High-Energy Electron-Induced SEUs and Jovian Environment Impact , 2017, IEEE Transactions on Nuclear Science.