Impact of Electron trapping on Energy Distribution Characterization of NBTI-Related Defects for Si p-FinFETs
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Z. Ji | A. Du | H. Yin | Wenwu Wang | Qingzhu Zhang | Zhaohao Zhang | Hong Yang | Renren Xu | Longda Zhou
暂无分享,去创建一个
Z. Ji | A. Du | H. Yin | Wenwu Wang | Qingzhu Zhang | Zhaohao Zhang | Hong Yang | Renren Xu | Longda Zhou