Evolution of traps in TiN/O3-sourced Al2O3/GaN gate structures with thermal annealing temperature
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Sen Huang | Chao Zhao | Qilong Bao | Xinhua Wang | K. Wei | Shiping Guo | Xinyu Liu | J. Xiang | Xuelin Yang | Yankui Li | B. Shen
暂无分享,去创建一个
Sen Huang | Chao Zhao | Qilong Bao | Xinhua Wang | K. Wei | Shiping Guo | Xinyu Liu | J. Xiang | Xuelin Yang | Yankui Li | B. Shen