论文信息 - Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

The frequency dependent loss tangent and dielectric constant has been determined for various dielectric materials using a stripline test fixture by employing differential and multiple-reflection-based measurement techniques with a vector network analyzer.

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