Imaging plate for time‐resolved x‐ray measurements (invited)

Two apparatus have been developed for time‐resolved measurements of x‐ray diffraction patterns using an imaging plate detector. The first one is based on a cinema method which permits up to 40 exposures of a two‐dimensional x‐ray pattern (100×108 mm2) with a 0.3‐s time resolution. The second one works as a 200‐mm‐long linear detector which enables a time resolution of 23 μs for a duration of up to 46 ms, based on a streak‐camera method. These apparatus have no count rate limitation, a high detective quantum efficiency (more than 80% for 8–20 keV), a 1:105 dynamic range in x‐ray intensity and a spatial resolution of 150 μm (FWHM) due to the performance of the imaging plate.