Measurement of the influence of dispersion on white-light interferometry.

White-light interferometry is a well-established method for measuring the height profiles of samples with rough as well as with smooth surfaces. Because white-light interferometry uses broadband light sources, the problem of dispersion arises. Because the optical paths in the two interferometer arms cannot be balanced for all wavelengths, the white-light correlogram is distorted, which interferes with its evaluation. We investigate the influence of setup parameters on the shape of the correlogram. Calculated values are compared with experimental results.

[1]  Kieran G. Larkin,et al.  The geometric phase: interferometric observations with white light , 1994 .

[2]  J Schwider,et al.  Dispersion error in white-light linnik interferometers and its implications for evaluation procedures. , 2001, Applied optics.

[3]  B L Danielson,et al.  Absolute optical ranging using low coherence interferometry. , 1991, Applied optics.

[4]  G. Häusler,et al.  Three-dimensional sensing of rough surfaces by coherence radar. , 1992, Applied optics.

[5]  Jim Kramer,et al.  Determination of fringe order in white-light interference microscopy. , 2002, Applied optics.

[6]  G S Kino,et al.  Mirau correlation microscope. , 1990, Applied optics.

[7]  D. F. Hays,et al.  Table of Integrals, Series, and Products , 1966 .

[8]  G. Häusler,et al.  Limits of Optical Range Sensors and How to Exploit Them , 1999 .

[9]  J. Biegen,et al.  Determination of the phase change on reflection from two-beam interference. , 1994, Optics letters.

[10]  Kieran G. Larkin,et al.  Efficient nonlinear algorithm for envelope detection in white light interferometry , 1996 .

[11]  Peter J. de Groot Chromatic dispersion effects in coherent absolute ranging. , 1992 .

[12]  M. Takeda,et al.  Coordinate-transform technique for closed-fringe analysis by the fourier-transform method. , 2001, Applied optics.

[13]  M. Ohmi,et al.  Simultaneous measurement of the phase and group indices and the thickness of transparent plates by low-coherence interferometry. , 1998, Optics letters.