Conservative and dissipative interactions in dynamic force microscopy

Dynamic force microscopy has proved to be a powerful imaging tool. Here, the tip of an atomic force microscope is vibrated at a high frequency, typically the resonance frequency of the lever sensor, and at a large vibration amplitude, typically of the order of 10 nm. Imaging contrast is obtained from measuring shifts of the resonance frequency, which provides information on conservative interactions, and of the Q-factor, which is sensitive to dissipative interactions. Problems associated with interaction sensing are discussed from a theoretical and an experimental point of view. Copyright © 1999 John Wiley & Sons, Ltd.

[1]  J. Frommer,et al.  Friction measurements on phase-separated thin films with a modified atomic force microscope , 1992, Nature.

[2]  Peter Grutter,et al.  Magnetic dissipation force microscopy , 1997 .

[3]  K. Johnson.  Contact Mechanics: Frontmatter , 1985 .

[4]  Franz J. Giessibl,et al.  Forces and frequency shifts in atomic-resolution dynamic-force microscopy , 1997 .

[5]  F. Giessibl,et al.  Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy , 1995, Science.

[6]  Y. Liu,et al.  Theory of magnetic dissipation imaging , 1997 .

[7]  M. Ohta,et al.  Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode , 1996 .

[8]  Hisae Yoshizawa,et al.  Fundamental mechanisms of interfacial friction. 1. Relation between adhesion and friction , 1993 .

[9]  Krueger,et al.  Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects. , 1996, Physical review. B, Condensed matter.

[10]  U. Dürig,et al.  Interaction force detection in scanning probe microscopy: Methods and applications , 1992 .

[11]  C. Gerber,et al.  Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7 , 1996 .

[12]  Winfried Denk,et al.  Local electrical dissipation imaged by scanning force microscopy , 1991 .

[13]  Harald Fuchs,et al.  Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation , 1998 .

[14]  C. Gerber,et al.  Surface Studies by Scanning Tunneling Microscopy , 1982 .

[15]  Urs Dürig,et al.  DYNAMIC FORCE MICROSCOPY BY MEANS OF THE PHASE-CONTROLLED OSCILLATOR METHOD , 1997 .

[16]  Urs Dürig,et al.  Atomic-scale metal adhesion investigated by scanning tunneling microscopy , 1994, IBM J. Res. Dev..

[17]  K. Kendall,et al.  Surface energy and the contact of elastic solids , 1971, Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences.

[18]  Y. Liu,et al.  THEORY OF MAGNETOELASTIC DISSIPATION DUE TO DOMAIN WALL WIDTH OSCILLATION , 1998 .

[19]  John R. Smith,et al.  Universal features of bonding in metals , 1983 .