An Antivibration Time-Delay Integration CMOS Image Sensor With Online Deblurring Algorithm

This paper presents an antivibration time-delay integration (TDI) CMOS image sensor (CIS) for small remote imaging systems, introducing a hardware-implemented online deblurring (ODB) algorithm to address the image blur problems caused by vibrations. The proposed sensor has eight TDI stages, column-parallel TDI accumulating and ODB circuits. A 256×8-pixel prototype chip was fabricated using a 0.18-μm CIS technology with a pixel footprint of 6.5 μm × 6.5 μm and a fill factor of 28%. Measurement results show that the sensor can achieve dynamic ranges of 45.1 and 51.8 dB, respectively, with and without enabling the ODB algorithm. Compared with a single-stage line scanner imager, it offers an improvement in signal-to-noise ratios of 1.9 and 8.6 dB, respectively, with and without the ODB algorithm.

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