论文信息 - Decompression of test data using variable-length seed LFSRs

Decompression of test data using variable-length seed LFSRs

This paper presents a new and efficient scheme to decompress a set of deterministic test vectors for circuits with scan. The scheme is based on the reseeding of a Multiple Polynomial Linear Feedback Shift Register (MP-LFSR) but uses variable-length seeds to improve the encoding efficiency of test vectors with a wide variation in their number of specified bits. The paper analyzes the effectiveness of this novel approach both theoretically and through extensive experiments. A modular design of the decompression hardware re-uses the same LFSR used for pseudo-random vector generation and scan registers to minimize the area overhead.

Janusz Rajski | Jerzy Tyszer | Nadime Zacharia

[1] Bernard Courtois,et al. Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers , 1992 .

[2] Hans-Joachim Wunderlich,et al. The pseudoexhaustive test of sequential circuits , 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[3] Janak H. Patel,et al. Design of Test Pattern Generators for Built-In Test , 1984, ITC.

[4] Edward J. McCluskey,et al. Circuits for Pseudo-Exhaustive Test Pattern Generation. , 1986 .

[5] Janusz Rajski,et al. On Linear Dependencies in Subspaces of LFSR-Generated Sequences , 1996, IEEE Trans. Computers.

[6] S. Hellebrand,et al. An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers , 1993, Proceedings of 1993 International Conference on Computer Aided Design (ICCAD).

[7] Arnold L. Rosenberg,et al. Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing , 1983, IEEE Transactions on Computers.

[8] B. Koenemann. LFSR-coded test patterns for scan designs , 1991 .

[9] Bernard Courtois,et al. Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers , 1995, IEEE Trans. Computers.

[10] Sheldon B. Akers,et al. Test set embedding in a built-in self-test environment , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.