USING CAIP FOR INSPECTION OF SUBSTRATE DESIGN

ABSTRACT The objective of this research is to simplify the process of substrate design inspection and increase the correctness rate of comparison by means of computer aided inspection planning(CAIP) techniques. In this paper, we adopted DXF as a media and developed a feature extraction procedure to extract the relative information such as width(or radius) and coordinates of traces and vias. Therefore, the original and modified designs were first transferred into DXF formats, and the features of trace and vias were extracted. Then, we applied a comparison procedure to classify the extracted features into three categories: exactly same features, feature with same position but different attribute, and different features. However, the modified design of traces and vias within a certain range are still acceptable, a knowledge base was constructed to determine the tolerance for acceptable features. Eventually, a compared DXF with different colors marked features was generated by the system.

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