Characterization of radiated emissions from power electronic devices : synthesis of an equivalent model from near-field measurement
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Lionel Pichon | David Baudry | B. Mazari | Olivier Maurice | Anne Louis | B. Essakhi | L. Pichon | D. Baudry | A. Louis | B. Mazari | B. Essakhi | O. Maurice
[1] Étude des perturbations conduites et rayonnées dans une cellule de commutation , 1993 .
[2] Igor V. Shvets,et al. Measurement of electric-field intensities using scanning near-field microwave microscopy , 2003 .
[3] M. Ribo,et al. A genetic algorithm based method for source identification and far-field radiated emissions prediction from near-field measurements for PCB characterization , 2001 .
[4] F. C. Wellstood,et al. Imaging microwave electric fields using a near-field scanning microwave microscope , 1998 .
[5] Tapan K. Sarkar,et al. Planar near-field to far-field transformation using an array of dipole probes , 1994 .
[6] T. Sarkar,et al. Planar near-field to far-field transformation using an equivalent magnetic current approach , 1992 .