A data-aware write-assist 10T SRAM cell with bit-interleaving capability
暂无分享,去创建一个
[1] Mohd. Hasan,et al. Single-Ended Schmitt-Trigger-Based Robust Low-Power SRAM Cell , 2016, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[2] A.P. Chandrakasan,et al. Static noise margin variation for sub-threshold SRAM in 65-nm CMOS , 2006, IEEE Journal of Solid-State Circuits.
[3] H. Fujiwara,et al. Which is the best dual-port SRAM in 45-nm process technology? — 8T, 10T single end, and 10T differential — , 2008, 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial.
[4] Hanwool Jeong,et al. Power-Gated 9T SRAM Cell for Low-Energy Operation , 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[5] Kaushik Roy,et al. A 32 kb 10T Sub-Threshold SRAM Array With Bit-Interleaving and Differential Read Scheme in 90 nm CMOS , 2009, IEEE Journal of Solid-State Circuits.
[6] R.H. Dennard,et al. An 8T-SRAM for Variability Tolerance and Low-Voltage Operation in High-Performance Caches , 2008, IEEE Journal of Solid-State Circuits.
[7] Sied Mehdi Fakhraie,et al. An 8T Low-Voltage and Low-Leakage Half-Selection Disturb-Free SRAM Using Bulk-CMOS and FinFETs , 2014, IEEE Transactions on Electron Devices.
[8] Chien-Yu Lu,et al. A 0.325 V, 600-kHz, 40-nm 72-kb 9T Subthreshold SRAM with Aligned Boosted Write Wordline and Negative Write Bitline Write-Assist , 2015, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[9] Kaushik Roy,et al. Ultralow-Voltage Process-Variation-Tolerant Schmitt-Trigger-Based SRAM Design , 2012, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[10] Yi Li,et al. Analysis of a read disturb-free 9T SRAM cell with bit-interleaving capability , 2014, Microelectron. J..
[11] Bahar Asgari,et al. Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS technology , 2017 .
[12] Sied Mehdi Fakhraie,et al. A 256-kb 9T Near-Threshold SRAM With 1k Cells per Bitline and Enhanced Write and Read Operations , 2015, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[13] Chien-Yu Lu,et al. A Single-Ended Disturb-Free 9T Subthreshold SRAM With Cross-Point Data-Aware Write Word-Line Structure, Negative Bit-Line, and Adaptive Read Operation Timing Tracing , 2012, IEEE Journal of Solid-State Circuits.
[14] J. Meindl,et al. The impact of intrinsic device fluctuations on CMOS SRAM cell stability , 2001, IEEE J. Solid State Circuits.
[15] E. Seevinck,et al. Static-noise margin analysis of MOS SRAM cells , 1987 .
[16] Yong-Bin Kim,et al. A Highly-Stable Nanometer Memory for Low-Power Design , 2008, 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems.
[17] Soumitra Pal,et al. A single ended write double ended read decoupled 8-T SRAM cell with improved read stability and writability , 2015, 2015 International Conference on Computer Communication and Informatics (ICCCI).