Raman scattering from very thin Si layers of Si/SiO2 superlattices: Experimental evidence of structural modification in the 0.8–3.5 nm thickness region
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Juha Sinkkonen | Markku Räsänen | Leonid Khriachtchev | Sergei Novikov | M. Räsänen | L. Khriachtchev | O. Kilpelä | S. Novikov | J. Sinkkonen | O. Kilpelä
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