论文信息 - Electrical Double-Layer Forces Measured with an Atomic Force Microscope while Electrochemically Controlling Surface Potential of the Cantilever - 字舞流文

Electrical Double-Layer Forces Measured with an Atomic Force Microscope while Electrochemically Controlling Surface Potential of the Cantilever

H. Hieda | Takashi Ishino | Kuniyoshi Tanaka Kuniyoshi Tanaka | Nobuhiro Gemma Nobuhiro Gemma