Modeling of photon scattering at high X-ray energies: experiment versus simulation

The use of a detailed Monte Carlo simulation code for X-ray fluorescence spectrometers is demonstrated for calculating the outcome of X-ray scattering experiments in the incident energy range 40-80 keV. The code was validated by comparisons of experimental and simulated spectral distributions in the case of thick, homogeneous samples in which multiple photon scattering occurs with high probability. The experimental spectral distributions were collected at beamline BW5 of HASYLAB, Germany, where a highly energetic, monochromatic synchrotron beam is available. With respect to heterogeneous samples, the code was employed to evaluate the use of Rayleigh and Compton scatter signals for obtaining three dimensional information on the sample dark matrix composition.

[1]  Fernández Je,et al.  Compton and Rayleigh double scattering of unpolarized radiation , 1991 .

[2]  R. D. Giauque,et al.  Determination of trace elements in light element matrices by x-ray fluorescence spectrometry with incoherent scattered radiation as an internal standard , 1979 .

[3]  Koen Janssens,et al.  A general Monte Carlo simulation of ED-XRF spectrometers. II: Polarized monochromatic radiation, homogeneous samples , 1995 .

[4]  R. Grieken,et al.  Absorption correction via scattered radiation in energy-dispersive x-ray fluorescence analysis for samples of variable composition and thickness , 1980 .

[5]  R. Gardner,et al.  Monte Carlo simulation of x-ray fluorescence from homogeneous multielement samples excited by continuous and discrete energy photons from x-ray tubes , 1975 .

[6]  Koen Janssens,et al.  Use of lead-glass capillaries for micro-focusing of highly-energetic (0–60 keV) synchrotron radiation , 1998 .

[7]  A. L. Hanson,et al.  Polarization effects on multiple scattering gamma transport , 1993 .

[8]  L. Vincze,et al.  Monte Carlo simulation of conventional and synchrotron energy‐dispersive x‐ray spectrometers , 1993 .

[9]  R. Grieken,et al.  Effective sample weight from scatter peaks in energy-dispersive x-ray fluorescence , 1979 .

[10]  Koen Janssens,et al.  A general Monte Carlo simulation of energy-dispersive X-ray fluorescence spectrometers. Part 3. Polarized polychromatic radiation, homogeneous samples , 1995 .

[11]  Jorge E. Fernandez,et al.  EDXRS modelling for in vivo trace element analysis by using the SHAPE code , 1993 .

[12]  Freddy C. Adams,et al.  A general Monte Carlo simulation of energy-dispersive X-ray fluorescence spectrometers—I: Unpolarized radiation, homogeneous samples , 1993 .

[13]  J. E. Fernandez,et al.  Monte Carlo computer simulation of the XRF intensity dependence on the propagation plane inclination , 1989 .

[14]  Jorge E. Fernandez.  Polarization effects and gamma transport , 1995 .