Analysis of single‐ and double‐crystal spectrometers using three‐dimensional DuMond diagrams and the high‐precision measurement of the Cu Kα1 line profile

The general principles of single- and double-crystal spectrometers are described using the three-dimensional DuMond diagram and new formulae for the resolution of the spectrometers are deduced. A method for measuring the fine structure of spectral lines with high precision is suggested and a generalized method of refraction correction is discussed. The Cu Kα line profile is measured carefully by double-crystal spectrometers using (nS, nS) and (nV, nR) arrangements, and a hump is found unambiguously on the long-wavelength side of the Cu Kα1 line.