A 0.27e-rms Read Noise 220-μV/e-Conversion Gain Reset-Gate-Less CMOS Image Sensor With 0.11-μm CIS Process

A low temporal read noise and high conversion gain reset-gate-less CMOS image sensor (CIS) has been developed and demonstrated for the first time at photoelectron-counting-level imaging. To achieve a high pixel conversion gain without fine or special processes, the proposed pixel has two unique structures: 1) coupling capacitance between the transfer gate and floating diffusion (FD) and 2) coupling capacitance between the reset gate and FD, for removing parasitic capacitances around the FD node. As a result, a CIS with the proposed pixels is able to achieve a high pixel conversion gain of 220 μV/e- and a low read noise of 0.27erms- using correlated multiple-sampling-based readout circuitry.

[1]  Min-Woong Seo,et al.  A low noise wide dynamic range CMOS image sensor with low-noise transistors and 17b column-parallel ADC , 2012, 2012 IEEE Sensors.

[2]  E. Fossum.  Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors , 2013, IEEE Journal of the Electron Devices Society.

[3]  Rihito Kuroda,et al.  A linear response single exposure CMOS image sensor with 0.5e− readout noise and 76ke− full well capacity , 2015, 2015 Symposium on VLSI Circuits (VLSI Circuits).

[4]  Albert J. P. Theuwissen,et al.  Single-photon imaging , 2011 .

[5]  Eric R. Fossum,et al.  A Pump-Gate Jot Device With High Conversion Gain for a Quanta Image Sensor , 2015, IEEE Journal of the Electron Devices Society.

[6]  Fu-Lung Hsueh,et al.  A 0.66e−rms temporal-readout-noise 3D-stacked CMOS image sensor with conditional correlated multiple sampling (CCMS) technique , 2015, 2015 Symposium on VLSI Circuits (VLSI Circuits).

[7]  Andrew J. Holmes,et al.  320×240 oversampled digital single photon counting image sensor , 2014, 2014 Symposium on VLSI Circuits Digest of Technical Papers.

[8]  Shoji Kawahito,et al.  A Low-Noise High-Dynamic-Range 17-b 1.3-Megapixel 30-fps CMOS Image Sensor With Column-Parallel Two-Stage Folding-Integration/Cyclic ADC , 2012, IEEE Transactions on Electron Devices.

[9]  Takehide Sawamoto,et al.  A Low Noise Wide Dynamic Range CMOS Image Sensor With Low-Noise Transistors and 17b Column-Parallel ADCs , 2013, IEEE Sensors Journal.

[10]  Shoji Kawahito,et al.  Effectiveness of a correlated multiple sampling differential averager for reducing 1/f noise , 2005, IEICE Electron. Express.

[11]  E. Fossum,et al.  Quanta Image Sensor Jot With Sub 0.3e- r.m.s. Read Noise and Photon Counting Capability , 2015, IEEE Electron Device Letters.

[12]  Shoji Kawahito,et al.  A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC , 2012, IEEE Journal of Solid-State Circuits.