AC longitudinal and contact resistance measurements of quantum Hall devices
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J. Melcher | G. Hein | Frederic Overney | K. Pierz | Jürgen Schurr | B. M. Wood | F. Overney | J. Melcher | K. Pierz | G. Hein | F. Ahlers | F-J Ahlers | B. Wood | J. Schurr
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