Quantitative depth profile analysis by direct current glow discharge time of flight mass spectrometry
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[1] R. Pereiro,et al. Analytical potential of a glow discharge chamber coupled to a time of flight mass spectrometer for qualitative in-depth profile analysis , 2003 .
[2] J. Zupan,et al. Optimization of lamp control parameters in glow discharge optical emission spectroscopy for the analysis of copper–titanium–zinc alloy using the Simplex method , 2003 .
[3] R. Pereiro,et al. Characterization of a simple glow discharge coupled to a time of flight mass spectrometer for in-depth profile analysis , 2002 .
[4] R. Pereiro,et al. Further development of a simple glow discharge source for direct solid analysis by on-axis time of flight mass spectrometry , 2002 .
[5] A. Sanz-Medel,et al. Critical comparison between quadrupole and time-of-flight inductively coupled plasma mass spectrometers for isotope ratio measurements in elemental speciation , 2002 .
[6] G. Hieftje,et al. Mass analyzers for inductively coupled plasma time-of-flight mass spectrometry , 2001 .
[7] I. Spitsberg,et al. Depth profile and quantitative trace element analysis of diffusion aluminided type layers on Ni-base superalloys using high-resolution glow-discharge mass spectrometry , 2001 .
[8] R. Pereiro,et al. In-depth profile analysis by radiofrequencyglow discharge optical emission spectrometry using pressure as variable parameter , 2001 .
[9] R. Fuoco,et al. Monitoring of Depth Distribution of Trace Elements by GDMS. , 2000 .
[10] W. Harrison,et al. Microsecond-pulsed Grimm glow discharge as a source for time-of-flight mass spectrometry , 2000 .
[11] L. A. D. L. Heras,et al. Investigation of mechanisms of corrosion due to diffusion of impurities by direct current glow discharge mass spectrometry depth profiling , 2000 .
[12] R. Pereiro,et al. In-depth quantitative analysis of conducting coatings by radiofrequency glow discharge optical emission spectrometry: influence of the source operation methodology , 2000 .
[13] A. Bengtson,et al. Development of a standard method for quantitative depth profile analysis of zinc‐based metallic coatings by direct current glow discharge optical emission spectroscopy , 1999 .
[14] X. Yan,et al. Glow discharge source interfacing to mass analyzers: theoretical and practical considerations. , 1999, Analytical chemistry.
[15] H. Emteborg,et al. Analytical performance of axial inductively coupled plasma time of flight mass spectrometry (ICP-TOFMS) , 1999 .
[16] Fumin Li,et al. Feasibility of applying microsecond-pulse glow discharge time of flight mass spectrometry in surface depth analysis , 1998 .
[17] W. Harrison,et al. Diffusion, Ionization, and Sampling Processes in the Glow Discharge Source for Mass Spectrometry , 1997 .
[18] Peng-yuan Yang,et al. Study of a pulsed glow discharge ion source for time-of-flight mass spectrometry , 1997 .
[19] R. Steiner,et al. Time-of-Flight Mass Spectrometry with a Pulsed Glow Discharge Ionization Source. , 1997, Analytical chemistry.
[20] D. Wayne. Direct Determination of Trace Noble Metals (Palladium, Platinum and Rhodium) in Automobile Catalysts by Glow Discharge Mass Spectrometry , 1997 .
[21] R. Grieken,et al. Quantitative Analysis of Zirconium Oxide by Direct Current Glow Discharge Mass Spectrometry Using a Secondary Cathode , 1997 .
[22] G. Hieftje,et al. Radio-Frequency-Powered Planar-Magnetron Glow Discharge as a Source for Time-of-Flight Elemental Mass Spectrometry , 1995 .
[23] R. Payling. In search of the ultimate experiment for quantitative depth profile analysis in glow discharge optical emission spectrometry. Part II: Generalized method , 1995 .
[24] A. Bengtson,et al. Quantitative depth profile analysis by glow discharge , 1994 .
[25] G. Horlick,et al. Analysis of aluminium alloys using inductively coupled plasma and glow discharge mass spectrometry , 1994 .
[26] R. Hutton,et al. Optimization of quantitative depth profiling with glow discharge mass spectrometry. Part 1. Optimization studies on crater shape and time–depth conversion , 1993 .
[27] Z. Weiss. Quantitative evaluation of depth profiles analysed by glow discharge optical emission spectroscopy: analysis of diffusion processes , 1992 .
[28] N. Jakubowski,et al. Application of glow discharge mass spectrometry with low mass resolution for in-depth analysis of technical surface layers , 1992 .