Chemical beam epitaxy
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[1] B. Joyce,et al. Reflection high‐energy electron diffraction oscillations from vicinal surfaces—a new approach to surface diffusion measurements , 1985 .
[2] J. Zyskind,et al. Chemical beam epitaxial growth of extremely high quality InGaAs on InP , 1986 .
[3] Gerald B. Stringfellow,et al. OMVPE growth of GaInP , 1983 .
[4] M. Mashita,et al. Silicon doping from disilane in gas source MBE of GaAs , 1987 .
[5] A. Y. Cho,et al. Bonding direction and surface‐structure orientation on GaAs (001) , 1976 .
[6] F. J. Morris,et al. A new GaAs, GaP, and GaAsxP1−x vacuum deposition technique using arsine and phosphine gas , 1974 .
[7] S. Hiyamizu,et al. MBE Growth of High-Quality GaAs Using Triethylgallium as a Gallium Source , 1986 .
[8] W. Tsang. The growth of GaAs, AIGaAs, InP and InGaAs by chemical beam epitaxy using group III and V alkyls , 1986 .
[9] T. Bridges,et al. Picosecond study of near-band-gap nonlinearities in GaInAsP , 1986 .
[10] Y. G. Chai,et al. A PH3 cracking furnace for molecular beam epitaxy , 1983 .
[11] G. B. Stringfellow,et al. Organometallic vapor phase epitaxial growth of InP using new phosphorus sources , 1986 .
[12] Henryk Temkin,et al. Gas source MBE of InP and GaxIn1−xPyAs1−y : Materials properties and heterostructure lasers , 1985 .
[13] H. Lüth,et al. A comparative study of Ga(CH3)3 and Ga(C2H5)3 in the mombe of GaAs , 1986 .
[14] N. M. Cho,et al. Optimal surface and growth front of III–V semiconductors in molecular beam epitaxy: A study of kinetic processes via reflection high energy electron diffraction specular beam intensity measurements on GaAs(100) , 1986 .
[15] S. Chu,et al. Optical properties of very thin GaInAs(P)/InP quantum wells grown by gas source molecular beam epitaxy , 1986 .
[16] P. Petroff,et al. GaInAs(P)/InP quantum well structures grown by gas source molecular beam epitaxy , 1985 .
[17] H. Kroemer,et al. Heterostructure bipolar transistors and integrated circuits , 1982, Proceedings of the IEEE.
[18] 1.6 µm wavelength GaInAsP/InP lasers prepared by two-phase solution technique , 1981, IEEE Journal of Quantum Electronics.
[19] Won-Tien Tsang,et al. Very low current threshold GaAs/Al0.5Ga0.5As double‐heterostructure lasers grown by chemical beam epitaxy , 1986 .
[20] W. Tsang. Chemical beam epitaxial growth of very low threshold Ga0.47In0.53As/InP double‐heterostructure and multiquantum well lasers , 1986 .
[21] W. Tsang,et al. Extremely high quality Ga0.47In0.53As/InP quantum wells grown by chemical beam epitaxy , 1986 .
[22] G. Qua,et al. InP/In0.53Ga0.47As heterojunction phototransistors grown by chemical beam epitaxy , 1987, IEEE Electron Device Letters.
[23] V. Deline,et al. The influence of growth chemistry on the MOVPE growth of GaAs and AlxGa1−xAs layers and heterostructures , 1986 .
[24] C. Fonstad,et al. (In,Ga)As/InP n-p-n heterojunction bipolar transistors grown by liquid phase epitaxy with high DC current gain , 1984, IEEE Electron Device Letters.
[25] C. Foxon,et al. Evaluation of surface kinetic data by the transform analysis of modulated molecular beam measurements , 1974 .
[26] W. Tsang. Chemical beam epitaxy of Ga0.47In0.53As/InP quantum wells and heterostructure devices , 1987 .
[27] M. Panish,et al. High-speed InGaAs(P)/InP double-heterostructure bipolar transistors , 1987, IEEE Electron Device Letters.
[28] Miller,et al. Theory of transient excitonic optical nonlinearities in semiconductor quantum-well structures. , 1985, Physical review. B, Condensed matter.
[29] Dependence of the conduction in In0.53Ga0.47As‐InP double‐barrier tunneling structures on the mesa‐etching process , 1987 .
[30] W. Tsang. Chemical beam epitaxy of InGaAs , 1985 .
[31] C. Dulcey,et al. Mechanistic studies of the decomposition of trimethylaluminum on heated surfaces , 1985 .
[32] J. R. Arthur. Interaction of Ga and As2 Molecular Beams with GaAs Surfaces , 1968 .
[33] K. Carey. Organometallic vapor phase epitaxial growth and characterization of high purity GaInAs on InP , 1985 .
[34] J. Harris,et al. Oscillations in the surface structure of Sn-doped GaAs during growth by MBE , 1981 .
[35] P. D. Moskowitz,et al. Hazard characterization and management of arsine and gallium arsenide in large-scale production of gallium arsenide thin film photovoltaic cells , 1986 .
[36] D.L. Miller,et al. AlGaAs/GaAs heterojunction bipolar transistors fabricated using a self-aligned dual-lift-off process , 1987, IEEE Electron Device Letters.
[37] Manijeh Razeghi,et al. Optical and crystallographic properties and impurity incorporation of GaxIn1−xAs (0.44 , 1983 .
[38] A. Mossman,et al. Effects of exposure to toxic gases: first aid and medical treatment , 1970 .
[39] G. B. Stringfellow,et al. Organometallic vapor phase epitaxial growth of high purity GaInAs using trimethylindium , 1984 .
[40] Harris,et al. Spectroscopy of excited states in In0.53Ga0.47 As-InP single quantum wells grown by chemical-beam epitaxy. , 1986, Physical review. B, Condensed matter.
[41] P. Francois. Dispersion-free single-mode doubly clad fibres with small pure bend losses , 1982 .
[42] Uziel Koren,et al. Wavelength selective interlayer directionally grating‐coupled InP/InGaAsP waveguide photodetection , 1987 .
[43] R. M. Redstall,et al. Applications of Electrochemical Methods for Semiconductor Characterization I . Highly Reproducible Carrier Concentration Profiling of VPE “Hi‐Lo” , 1980 .
[44] 1.55‐μm optical logic étalon with picojoule switching energy made of InGaAs/InP multiple quantum wells , 1987 .
[45] M. Panish. Molecular Beam Epitaxy of GaAs and InP with Gas Sources for As and P , 1980 .
[46] A. Calawa. On the use of AsH3 in the molecular beam epitaxial growth of GaAs , 1981 .
[47] S. Chu,et al. Ga0.47In0.53As/InP superlattices grown by chemical beam epitaxy: Absorption, photoluminescence excitation, and photocurrent spectroscopies , 1987 .
[48] S. Denbaars,et al. Homogeneous and heterogeneous thermal decomposition rates of trimethylgallium and arsine and their relevance to the growth of GaAs by MOCVD , 1986 .
[49] J. Butler,et al. In situ, real-time diagnostics of OMVPE using IR-diode laser spectroscopy☆ , 1986 .
[50] D. Tsui,et al. Electronic properties of In0.53Ga0.47As‐InP single quantum wells grown by chemical beam epitaxy , 1987 .
[51] Anupam Madhukar,et al. Reflection high energy electron diffraction intensity behavior during homoepitaxial molecular beam epitaxy growth of GaAs and implications for growth kinetics and mechanisms , 1985 .
[52] Joe C. Campbell,et al. High-speed InP/InGaAsP/InGaAs avalanche photodiodes grown by chemical beam epitaxy , 1988 .
[53] B. Joyce,et al. Dynamic effects in RHEED from MBE grown GaAs(001) surfaces , 1986 .
[54] M. G. Jacko,et al. THE PYROLYSIS OF TRIMETHYL GALLIUM , 1963 .
[55] Jasprit Singh,et al. A study of novel growth approaches to influence the growth mechanism and interface quality in heterostructures grown by molecular beam epitaxy , 1986 .
[56] B. Kasper,et al. High-performance avalanche photodiode with separate absorption ‘grading’ and multiplication regions , 1983 .
[57] G. B. Stringfellow. VPE Growth of III/V Semiconductors , 1978 .
[58] C. Wood. RED intensity oscillations during MBE of GaAs , 1981 .
[59] M. Panish,et al. InGaAs/InP double-heterostructure bipolar transistors with near-ideal β versus ICcharacteristic , 1986, IEEE Electron Device Letters.
[60] G. B. Stringfellow,et al. Use of tertiarybutylarsine for GaAs growth , 1987 .
[61] Very high quality single and multiple GaAs quantum wells grown by chemical beam epitaxy , 1986 .
[62] J. Cunningham,et al. Observations on intensity oscillations in reflection high‐energy electron diffraction during chemical beam epitaxy , 1987 .
[63] R. R. O'Brien,et al. On the measurement of impurity atom distributions by the differential capacitance technique , 1969 .
[64] Won-Tien Tsang,et al. High performance Ga0.47In0.53As photoconductive detectors grown by chemical beam epitaxy , 1986 .
[65] H. Yamauchi,et al. Metabolism and excretion of orally ingested trimethylarsenic in man , 1984, Bulletin of environmental contamination and toxicology.
[66] H. Henisch,et al. Drift-diffusion theory of symmetrical double-junction diodes , 1982 .
[67] Won-Tien Tsang,et al. Elimination of oval defects in epilayers by using chemical beam epitaxy , 1985 .
[68] W. Tsang,et al. Two-dimensional electron gas in a Ga0.47In0.53As/InP heterojunction grown by chemical beam epitaxy , 1986 .
[69] T. Ishibashi,et al. High-frequency characteristics of AlGaAs/GaAs heterojunction bipolar transistors , 1984, IEEE Electron Device Letters.
[70] Park,et al. Room-temperature optical nonlinearities in GaAs. , 1986, Physical review letters.
[71] W. C. Johnson,et al. The influence of debye length on the C-V measurement of doping profiles , 1971 .
[72] J. Gibbons,et al. Growth of GaAs by metalorganic chemical vapor deposition using thermally decomposed trimethylarsenic , 1987 .
[73] B. Joyce,et al. Temporal intensity variations in RHEED patterns during film growth of GaAs by MBE , 1983 .
[74] M. Lambert,et al. Epitaxie par jets moléculaires de In0.53Ga0.47As et de InP sur substrats de InP , 1983 .
[75] R. Bhat,et al. Growth of high‐quality GaAs using trimethylgallium and diethylarsine , 1987 .
[76] S. Price,et al. Pyrolysis of triethylgallium by the toluene carrier technique , 1979 .
[77] Salah M. Bedair,et al. Atomic layer epitaxy of III‐V binary compounds , 1985 .
[78] W. Tsang. GaInAsP/InP double heterostructure lasers emitting at 1.5 μm grown by chemical beam epitaxy , 1987 .
[79] H. Lüth,et al. Doping of GaAs in metalorganic MBE using gaseous sources , 1987 .
[80] E. Burkhardt,et al. Growth of high‐quality GaxIn1−xAsyP1−y by chemical beam epitaxy , 1987 .
[81] M. Mashita,et al. The pyrolysis temperature of triethylgallium in the presence of arsine of trimethylaluminum , 1986 .
[82] W. Tsang. Chemical beam epitaxy of InP and GaAs , 1984 .
[83] S. Namba,et al. Stepwise monolayer growth of GaAs by switched laser metalorganic vapor phase epitaxy , 1986 .
[84] Base doping effects in InGaAs/InP double heterostructure bipolar transistors , 1986, 1986 International Electron Devices Meeting.
[85] J. Cunningham,et al. Gallium- and arsenic-induced oscillations of intensity of reflection high-energy electron diffraction in the growth of (001) GaAs by chemical beam epitaxy , 1987 .
[86] W. Tsang,et al. Chemical beam epitaxial growth of high‐purity GaAs using triethylgallium and arsine , 1987 .
[87] W. Tsang,et al. 1.3‐μm wavelength GaInAsP/InP double heterostructure lasers grown by molecular beam epitaxy , 1982 .
[88] D. Miller,et al. Room temperature excitonic nonlinear absorption and refraction in GaAs/AlGaAs multiple quantum well structures , 1984 .
[89] J. Campbell,et al. InGaAs/InP p‐i‐n photodiodes grown by chemical beam epitaxy , 1986 .
[90] R. M. Lum,et al. An integrated laboratory-reactor MOCVD safety system , 1986 .
[91] John E. Bowers,et al. InP/InGaAsP/InGaAs avalanche photodiodes with 70 GHz gain‐bandwidth product , 1987 .
[92] High-transconductance heterostructure Ga/sub 0.47/In/sub 0.53/As/InP metal-insulator-semiconductor field-effect transistors grown by chemical beam epitaxy , 1988, IEEE Electron Device Letters.
[93] M. Lamont,et al. Use of tertiarybutylarsine in the metalorganic chemical vapor deposition growth of GaAs , 1987 .
[94] B. Joyce,et al. Dynamic RHEED observations of the MBE growth of GaAs , 1984 .
[95] Henryk Temkin,et al. High gain InGaAs/InP heterostructure bipolar transistors grown by gas source molecular beam epitaxy , 1986 .
[96] A. Springthorpe,et al. Metalorganic chemical-vapour-deposition growth and characterization of GaAs , 1985 .
[97] Haila Wang,et al. High current gain heterojunction bipolar phototransistor for monolithic integrated photoreceiver , 1987 .
[98] W. Tsang,et al. Doping studies using thermal beams in chemical‐beam epitaxy , 1986 .
[99] G. B. Stringfellow. Chapter 3 Organometallic Vapor-Phase Epitaxial Growth of III–V Semiconductors , 1985 .
[100] S. G. Napholtz,et al. 1.5‐μm GaInAsP planar buried heterostructure lasers grown using chemical‐beam‐epitaxial base structures , 1988 .
[101] K. Hirose,et al. High Mobility GaInAs Thin Layers Grown by Molecular Beam Epitaxy , 1985 .
[102] W. Tsang. Ga 0.47 In 0.53 As/InP double-heterostructure and multiquantum well lasers grown by chemical beam epitaxy , 1987 .
[103] S. J. Bass,et al. High quality epitaxial indium phosphide and indium alloys grown using trimethylindium and phosphine in an atmospheric pressure reactor , 1984 .
[104] David A. B. Miller,et al. Nonlinear spectroscopy of InGaAs/InAlAs multiple quantum well structures , 1986 .
[105] C. B. Cooper,et al. Improved mobility in OM-VPE-grown Ga1-xInxAs , 1981 .
[106] J. Riou,et al. Diffused epitaxial GaAlAs‐GaAs heterojunction bipolar transistor for high‐frequency operation , 1982 .
[107] P. J. Corvini,et al. Spectral dependence of propagation loss in InP/InGaAsP antiresonant reflecting optical waveguides grown by chemical beam epitaxy , 1987 .
[108] G. B. Stringfellow,et al. Atomic steps at GaInAs/InP interfaces grown by organometallic vapor phase epitaxy , 1988 .
[109] J. R. Arthur,et al. Molecular beam epitaxy , 1975 .
[110] Karl Woodbridge,et al. RHEED Studies of Heterojunction and Quantum Well Formation during MBE Growth - from Multiple Scattering to Band Offsets , 1985 .
[111] P. Pukite,et al. The dependence of RHEED oscillations on MBE growth parameters , 1985 .
[112] M. Panish,et al. Gas source molecular beam epitaxy of GaxIn1−xPyAs1−y , 1984 .
[113] D. Miller,et al. Room‐temperature excitons in 1.6‐μm band‐gap GaInAs/AlInAs quantum wells , 1985 .