论文信息 - Immunity Modeling of Integrated Circuits: An Industrial Case

Immunity Modeling of Integrated Circuits: An Industrial Case

This paper introduces a new technique for electromagnetic immunity modeling of integrated circuits (ICs), compliant with industrial requirements and valid up to 3 GHz. A specific modeling flow is introduced, which makes it possible to predict the conducted immunity of an IC according to a given criterion, whatever its external environment. This methodology was validated through measurements performed on several devices.

Richard Perdriau | M'hamed Drissi | Mohammed Ramdani | Frédéric Lafon | François de Daran

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