Electrical Properties of High-K LaLuO3 Gate Oxide for SOI MOSFETs
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P. Hurley | Y. Gomeniuk | J. Schubert | S. Monaghan | K. Cherkaoui | A. Nazarov | P. Hellström | J. Lopes | H. Gottlob | Y. Gomeniuk
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P. Hurley | Y. Gomeniuk | J. Schubert | S. Monaghan | K. Cherkaoui | A. Nazarov | P. Hellström | J. Lopes | H. Gottlob | Y. Gomeniuk