Pseudo-Exhaustive Random Access Memory Testing Based on March Tests with Random Background Variation

Studying the efficiency of memory system tests, we have to take into consideration the complexity of generating all 2k combinations for k memory cells, which is an essential and in many cases sufficient condition, which allows detecting different complex faults given by a parameter k. This paper introduces a new concept for pseudo exhaustive computer memory testing based on multi-run march tests with random backgrounds. The analytical estimation as the approximation of the pseudo-exhaustive test complexity based on the Coupon Collector's Problem was obtained. The set of experimental validation results have been presented and analyzed.

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