论文信息 - Nanoscale EELS analysis of oxides: composition mapping, valence determination and beam damage - 字舞流文

Nanoscale EELS analysis of oxides: composition mapping, valence determination and beam damage

C. B. Carter | F. Cosandey | J. Al-sharab | J. Bentley | I. Anderson | S. R. Gilliss | P. Kotula