Optical Phase-Shift Measurement of Carrier Decay Times (77°K) on Lightly Doped Double-Surface and Surface-Free Epitaxial GaAs
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R. D. Burnham | Nick Holonyak | N. Holonyak | M. Craford | D. Scifres | R. Burnham | D. R. Scifres | D. L. Keune | Magnus George Craford | H. R. Zwicker | J. W. Burd | D. L. Dickus | M. J. Fox | H. Zwicker | D. Keune
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