Optical heterodyne grating shearing interferometry for long-range positioning applications
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Ju-Yi Lee | Ju-Yi Lee | Ming Lu | Ming-Pei Lu
[1] Jong-Ho Park,et al. Ultra Precision Positining System for Servo Motor-piezo Actuator Using the Dual Servo Loop and Digital Filter Implementation , 1999 .
[2] Arnold Teimel,et al. Technology and applications of grating interferometers in high-precision measurement , 1992 .
[3] Olivier Parriaux,et al. A silicon integrated opto-electro-mechanical displacement sensor , 2004 .
[4] Steve D. Slonaker,et al. Step-and-scan and step-and-repeat: a technology comparison , 1996, Advanced Lithography.
[5] T Yatagai,et al. Phase measuring Ronchi test. , 1988, Applied optics.
[6] Der-Chin Su,et al. Simple two-frequency laser , 1996 .
[7] D. Malacara. Optical Shop Testing , 1978 .
[8] S. Topcu,et al. Heterodyne interferometric technique for displacement control at the nanometric scale , 2003 .
[9] K. Hibino,et al. Dynamic range of Ronchi test with a phase-shifted sinusoidal grating. , 1997, Applied optics.
[10] Estler Wt,et al. High-accuracy displacement interferometry in air. , 1985 .
[11] Chyan-Chyi Wu,et al. Reflection type heterodyne grating interferometry for in-plane displacement measurement , 2008 .
[12] S Tonchev,et al. High-accuracy translation-rotation encoder with two gratings in a Littrow mount. , 1999, Applied optics.
[13] Chien-Ming Wu,et al. Heterodyne interferometric system with subnanometer accuracy for measurement of straightness. , 2004, Applied optics.
[14] Chyan-Chyi Wu,et al. Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution , 2007 .
[15] William J. Dauksher,et al. Imprint lithography for integrated circuit fabrication , 2003 .
[16] Grating-assisted optical microprobing of in-plane and out-of-plane displacements of microelectromechanical devices , 2006 .
[17] Mao-Hong Lu,et al. Double-diffraction planar encoder by conjugate optics , 2005 .
[18] Massood Tabib-Azar,et al. Sensing means and sensor shells : a new method of comparative study of piezoelectric, piezoresistive, electrostatic, magnetic, and optical sensors , 1995 .
[19] Cheon Il Eom,et al. Dual mode phase measurement for optical heterodyne interferometry , 2000 .