Hard x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution.
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Q. Shen | F. Carlo | Y. Chu | Wah‐Keat Lee | W. Yun | G. Margaritondo | Hsin-jay Wu | Chung-Shi Yang | Y. Hwu | K. Liang | J. Yi | Cheng-Liang Wang | Jiajun Wang | C. J. Liu | Ch Wang | S. R. Wu | Chia‐Chi Chien | A. Tkachuk | M. Feser | J. Je | C. Chien | C. Liu