A Novel Approach for Improving the Quality of Open Fault Diagnosis
暂无分享,去创建一个
Masaki Hashizume | Hiroyuki Yotsuyanagi | Yuzo Takamatsu | Yoshinobu Higami | Koji Yamazaki | Hiroshi Takahashi | Takashi Aikyo | Toshiyuki Tsutsumi
[1] H. Takahashi,et al. Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines , 2007, 16th Asian Test Symposium (ATS 2007).
[2] R. D. Blanton,et al. A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior , 2006, 2006 IEEE International Test Conference.
[3] Srikanth Venkataraman,et al. A technique for logic fault diagnosis of interconnect open defects , 2000, Proceedings 18th IEEE VLSI Test Symposium.
[4] Masahiro Takakura,et al. A persistent diagnostic technique for unstable defects , 2002, Proceedings. International Test Conference.
[5] Shi-Yu Huang. Diagnosis of Byzantine open-segment faults [scan testing] , 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..
[6] S.M. Reddy,et al. Interconnect Open Defect Diagnosis with Physical Information , 2006, 2006 15th Asian Test Symposium.
[7] Camelia Hora,et al. Diagnosis of Full Open Defects in Interconnecting Lines , 2007, 25th IEEE VLSI Test Symposium (VTS'07).
[8] I. Pomeranz,et al. On testing of interconnect open defects in combinational logic circuits with stems of large fanout , 2002, Proceedings. International Test Conference.
[9] Yuichi Sato,et al. Failure analysis of open faults by using detecting/un-detecting information on tests , 2004, 13th Asian Test Symposium.
[10] Toshiyuki Maeda,et al. Invisible delay quality - SDQM model lights up what could not be seen , 2005, IEEE International Conference on Test, 2005..
[11] Sudhakar M. Reddy,et al. Interconnect open defect diagnosis with minimal physical information , 2007, 2007 IEEE International Test Conference.