Probe card comprising dual support frame

A probe card with a dual support frame is provided to prevent the thermal deformation between the main board and the frame from affecting a probe block by fixing the probe blocks in a second support frame separated from the main board. A main frame(20) is installed in a first side(13) of a main board(10). A first support frame(30) is installed on the main frame. A second support frame(40) is arranged on a second side of the main board. A plurality of connecting members(50) pass through the main board and the main frame and connect the first support frame and the second support frame. The second support frame is separated from the main board. A plurality of probe blocks(60) are connected to the interposer and are installed in the second support frame by being coupled with the connecting members protruded from the second support frame downward.