Amplitude and Phase Measurements of Highly Focused Light in Optical Data Storage Systems

We propose a new measurement technique to investigate the highly focused light used in optical data storage systems named immersion high resolution interference microscopy (HRIM). This system allows three-dimensional (3D) measurements of the amplitude and phase of light fields in a static scheme. In contrast to scanning techniques, HRIM allows the nondestructive investigation penetrating through the optical disc. We investigated the focusing of light in high-definition digital versatile disc (HD DVD) systems. The experimental spot sizes agree well with the theory in intensity measurements. The measured phase distributions resemble the wavefront propagation of aberration-free converging light beams. The observed phase singularity positions near the focal plane demonstrate the super-resolution capability of such measurements and give access to details of the Airy pattern. Our results prove the applicability of studying highly focused beams in advanced optical systems and its use to clarify storage mechanisms for future generations of optical memories. # 2010 The Japan Society of Applied Physics

[1]  G. Kino,et al.  High-density optical recording using a solid immersion lens. , 1997, Applied optics.

[2]  Hervé Rigneault,et al.  Direct imaging of photonic nanojets. , 2008, Optics express.

[3]  Theoretical and experimental investigation of phase singularities generated by optical micro- and nano-structures , 2004 .

[4]  Lambertus Hesselink,et al.  Mechanisms for Enhancing Power Throughput from Planar Nano-Apertures for Near-Field Optical Data Storage , 2002 .

[5]  J. Schwider,et al.  Digital wave-front measuring interferometry: some systematic error sources. , 1983, Applied optics.

[6]  G. S. Kino,et al.  High-numerical-aperture lens system for optical storage , 1993 .

[7]  Takashi Nakano,et al.  An approach for recording and readout beyond the diffraction limit with an Sb thin film , 1998 .

[8]  Toralf Scharf,et al.  High Resolution Interference Microscopy: A Tool for Probing Optical Waves in the Far-Field on a Nanometric Length Scale , 2006 .

[9]  Din Ping Tsai,et al.  Probing the near fields of the super-resolution near-field optical structure , 2000 .

[10]  A. Raighne,et al.  Emerging light fields from liquid crystal microlenses , 2006 .

[11]  Ramon Pericet-Camara,et al.  Arrays of microlenses with variable focal lengths fabricated by restructuring polymer surfaces with an ink-jet device. , 2007, Optics express.

[12]  Toralf Scharf,et al.  Microlenses with annular amplitude and phase masks , 2007 .

[13]  J. Braat,et al.  High-density optical data storage , 2006 .