论文信息 - Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node - 字舞流文

Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

T. D. Loveless | L. Massengill | B. Bhuva | D. Rennie | S. Jagannathan | M. Mccurdy | T. Reece | J. Chetia | S. Wen | R. Wong | Lloyd W. Massengill | Bharat L. Bhuva | Rick Wong | David Rennie