论文信息 - Determination of penetration depths and analysis of strains in single crystals by white beam synchrotron X-ray topography in grazing Bragg-Laue geometries - 字舞流文

Determination of penetration depths and analysis of strains in single crystals by white beam synchrotron X-ray topography in grazing Bragg-Laue geometries

M. Dudley | G. Yao | J. Wu

[1] J. Bilello,et al. Depth profiling of defects in epilayer semiconductor materials by using synchrotron x‐radiation topography , 1987 .

[2] A. Afanas’ev,et al. X‐ray topography of thin subsurface layers , 1985 .

[3] S. Stepanov,et al. Bragg-Laue diffraction in inclined geometry , 1984 .

[4] R. M. Imamov,et al. Grazing Bragg-Laue Diffraction for Studying the Crystal Structure of Thin Films , 1984, November 16.

[5] R. M. Imamov,et al. Photoeffect in X‐ray grazing incidence diffraction , 1984 .

[6] M. Dudley,et al. Projective properties of Laue topographs , 1980 .

[7] J. Pétroff,et al. Synchrotron-radiation plane-wave topography I. Application to misfit dislocation imaging in III-V heterojunctions , 1980 .

[8] A. Cho,et al. X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface , 1979 .

[9] T. Vreeland. Stereographic X-ray reflection topography of dislocations in zinc , 1976 .

[10] A. Turner,et al. Experimental techniques for observing dislocations by the Berg–Barrett method , 1968 .

[11] R. Armstrong,et al. ‘seeing’ dislocations in zinc , 1964 .