Influence of gallium supersaturation on the properties of GaN grown by metalorganic chemical vapor deposition

A thermodynamic supersaturation model for gallium (Ga) was developed to describe GaN growth characteristics in low-pressure metalorganic chemical vapor deposition. The model takes into account the simplified GaN chemical reaction that occurs at the growth interface, Ga+NH3=GaN+3/2H2. The supersaturation was varied in two ways: (1) by the V/III ratio and (2) by the choice of the diluent gas. Two diluent gases were considered: H2, a commonly used diluent gas, and N2, a reaction inert gas. The choice of the diluent played a role in the degree of Ga supersaturation; since H2 is the product in the GaN formation, the addition of hydrogen significantly lowered the supersaturation. Atomic force microscopy revealed that surface morphology was associated with the different Ga supersaturation and the Burton–Cabrera–Frank model was used to relate it to the observed spiral size and terrace width. In addition to growth morphology, the degree of Ga supersaturation also influenced the carrier compensation level in n-type...

[1]  J. Furthmüller,et al.  Theoretical investigation of edge dislocations in AlN , 1998 .

[2]  S. Fuke,et al.  Review of polarity determination and control of GaN , 2004 .

[3]  R. Schlesser,et al.  Growth of Ga- and N- polar gallium nitride layers by metalorganic vapor phase epitaxy on sapphire wafers , 2006 .

[4]  V. S. Ban,et al.  Mass Spectrometric Studies of Vapor‐Phase Crystal Growth II . , 1971 .

[5]  Briggs,et al.  Native defects in gallium nitride. , 1995, Physical review. B, Condensed matter.

[6]  Hadis Morkoç,et al.  Nitride Semiconductors and Devices , 1999 .

[7]  C. T. Foxon,et al.  The electron mobility and compensation in n-type GaN , 1998 .

[8]  Hui Yang,et al.  Surface morphology of AlN buffer layer and its effect on GaN growth by metalorganic chemical vapor deposition , 2004 .

[9]  Olivier Briot,et al.  Gallium vacancies and the growth stoichiometry of GaN studied by positron annihilation spectroscopy , 1998 .

[10]  Jörg Neugebauer,et al.  Gallium vacancies and the yellow luminescence in GaN , 1996 .

[11]  A. Koukitu,et al.  Thermodynamic study on the role of hydrogen during the MOVPE growth of group III nitrides , 1999 .

[12]  Hui Yang,et al.  Effects of edge dislocations and intentional Si doping on the electron mobility of n-type GaN films , 2006 .

[13]  R. J. Shul,et al.  GAN : PROCESSING, DEFECTS, AND DEVICES , 1999 .

[14]  N. Browning,et al.  Direct experimental observation of the local electronic structure at threading dislocations in metalorganic vapor phase epitaxy grown wurtzite GaN thin films , 2000 .

[15]  H. Amano,et al.  Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layer , 1986 .

[16]  Characteristics of nucleation layer and epitaxy in GaN/sapphire heterostructures , 2006 .

[17]  Michael S. Shur,et al.  Monte Carlo calculation of velocity-field characteristics of wurtzite GaN , 1997 .

[18]  Lester F. Eastman,et al.  Scattering of electrons at threading dislocations in GaN , 1998 .

[19]  D. Stevenson,et al.  Growth Kinetics and Catalytic Effects in the Vapor Phase Epitaxy of Gallium Nitride , 1978 .

[20]  Y. Kumagai,et al.  Thermodynamic analysis of group III nitrides grown by metal-organic vapour-phase epitaxy (MOVPE), hydride (or halide) vapour-phase epitaxy (HVPE) and molecular beam epitaxy (MBE) , 2001 .

[21]  Steven A. Ringel,et al.  Impact of carbon on trap states in n-type GaN grown by metalorganic chemical vapor deposition , 2004 .

[22]  D. Rode,et al.  Electron Hall mobility of n‐GaN , 1995 .

[23]  Alan Francis Wright,et al.  Role of carbon in GaN , 2002 .

[24]  I. Akasaki Progress in crystal growth of nitride semiconductors , 2000 .

[25]  W. Read LXXXVII. Theory of dislocations in germanium , 1954 .

[26]  J. H. You,et al.  Electron scattering due to threading edge dislocations in n-type wurtzite GaN , 2006 .

[27]  R. Dalmau,et al.  Growth of highly resistive Ga‐polar GaN by LP‐MOVPE , 2007 .

[28]  Sven Einfeldt,et al.  X-ray diffraction analysis of the defect structure in epitaxial GaN , 2000 .

[29]  R. Schlesser,et al.  Current-voltage characteristics of n∕n lateral polarity junctions in GaN , 2006 .

[30]  W. K. Burton,et al.  The growth of crystals and the equilibrium structure of their surfaces , 1951, Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences.