Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy
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M. Andreae | B. Weber | C. Pöhlker | M. Weigand | M. Kappl | A. Kilcoyne | Dorothea S. Macholdt | K. Jochum | Jan-David Förster | Maren Müller | J. Leitner | C. Pöhlker | Klaus Peter Jochum