Two Heuristic Algorithms for Test Point Selection in Analog Circuit Diagnoses

The paper presents a heuristic approach to the prob lem of analog circuit diagnosis. Different optimiza tion techniques in the field of test point selection are discussed. Two new algorithms: SALTO and COSMO have been introduced. Both searching procedures have been implemented in a form of the expert system in PROLOG language. The proposed methodologies have bee n exemplified on benchmark circuits. The obtained r esults have been compared to the others achieved by different a pproaches in the field and the benefits of the prop osed methodology have been emphasized. The inference engine of the heuristic algorithms has been presented and the expert system knowledge-base construction discussed.

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